Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions

The technique for predicting RFID passive tag power supply system reliability, the failure of which is caused by the degradation of RTDs that are part of the tag rectifier, is developed. The calculation of the time to failure of the RFID passive tag power supply system by the criterion of the minimum permissible range is presented based on the developed technique. © The Authors, published by EDP Sciences, 2018.

Авторы
Makeev M. 1, 2 , Sinyakin V.1 , Meshkov S.1
Сборник материалов конференции
Издательство
EDP Sciences
Язык
Английский
Статус
Опубликовано
Номер
02095
Том
224
Год
2018
Организации
  • 1 Bauman Moscow State Technical University, Moscow, 105005, Russian Federation
  • 2 Peoples' Friendship University of Russia (RUDN University), Moscow, 117198, Russian Federation
Ключевые слова
Electric rectifiers; Manufacture; Outages; Reliability; Operating condition; Passive tags; Power supply; Reliability prediction; Time to failure; Electric power systems
Дата создания
04.02.2019
Дата изменения
04.02.2019
Постоянная ссылка
https://repository.rudn.ru/ru/records/article/record/36273/