Polarization Spectroscopy of a Conducting Surface

A method of polarization spectroscopy for a conducting surface characterized by a high sensitivity to the state of the surface and its transition layer is proposed. The method uses excitation of surface electromagnetic waves (SEWs) by a linearly polarized probe beam incident on the surface under study and compensation for the phase shift between the p and s components arising upon the SEW excitation. The applicability and competitiveness of the method in both the visible and the IR range is established. The method is tested on an LEF-3M ellipsometer in the visible range by studying the oxidation process in an evaporated copper film. © 2007 MAIK "Nauka/Interperiodica".

Авторы
Редакторы
-
Издательство
-
Номер выпуска
6
Язык
Английский
Страницы
872-876
Статус
Опубликовано
Подразделение
-
Номер
-
Том
90
Год
2001
Организации
  • 1 Russian Univ. of Peoples Friendship, Moscow 117419, Russian Federation
Ключевые слова
Electric fields; Ellipsometry; Photodetectors; Spectroscopic analysis; Surface phenomena; Conducting surface; Electromagnetic wave polarization
Дата создания
19.10.2018
Дата изменения
19.10.2018
Постоянная ссылка
https://repository.rudn.ru/ru/records/article/record/329/