Comparative analysis of application of wavelet analysis for the recognition of element composition nanostructures

The paper presents a technique for applying a wavelet analysis (continuous and discrete wavelet transforms) to analyze the elemental composition of nanostructures in order to identify the chemical composition. The experimental data were obtained by means of a scanning electron microscope. The acquisition, processing and study of spectra were carried out using the author's software product "labpraktikum-osnov-wavelet". © 2019 IOP Publishing Ltd. All rights reserved.

Authors
Tkachenko I.M. 1 , Kozhanova E.R.2 , Belyaev V.V. 1, 3 , Yazbeck H. 1
Conference proceedings
Journal of Physics: Conference Series
Publisher
Institute of Physics Publishing
Number of issue
1
Language
English
Status
Published
DOI
10.1088/1742-6596/1309/1/012020
Number
012020
Volume
1309
Year
2019
Organizations
  • 1 RUDN University (Peoples' Friendship University of Russia), Moscow, Russian Federation
  • 2 Yuri Gagarin State Technical University of Saratov, Saratov, Russian Federation
  • 3 Moscow Region State University, Very Voloshinoy str., 24, Mytishi, 141014, Russian Federation
Keywords
Discrete wavelet transforms; Nanostructures; Scanning electron microscopy; Wavelet analysis; Chemical compositions; Comparative analysis; Element compositions; Elemental compositions; Software products; Chemical analysis
Date of creation
24.12.2019
Date of change
24.12.2019
Short link
https://repository.rudn.ru/en/records/article/record/55028/
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