2018 International Russian Automation Conference, RusAutoCon 2018.
Institute of Electrical and Electronics Engineers Inc..
2018.
Reliability prediction of radio frequency identification passive tags power supply systems based on a3b5 resonant-tunneling diodes
The methodology of predicting radio frequency identification (RFID) passive tag power supply system reliability is developed. The reliability of a RFID passive tag power supply system is estimated in terms of a parametric failure associated with the I-V characteristics drift of resonant-tunneling diodes (RTD) that are a part of the tag rectifier under the influence of external factors beyond the tolerance limits. The methodology of the time to failure of the RFID passive tag power supply system calculation by the criterion of the minimum permissible range is presented. The developed methodology can be used in the design of RFID systems with passive UHF and SHF tags to predict their reliability under specified operating conditions. The developed algorithms and software modules can be integrated into the corresponding CAD systems. © 2018 IEEE.
Authors
Makeev M.
1,
2
,
Sinyakin V.3
,
Meshkov S.3
Conference proceedings
Publisher
Institute of Electrical and Electronics Engineers Inc.
Language
English
Status
Published
Number
8501748
Year
2018
Organizations
- 1 Bauman Moscow State Technical University, RandE Center Functional Micro/Nanosystems, Moscow, Russian Federation
- 2 Academy of Engineering, Department of Mechanics and Mechatronics, Peoples' Friendship University of Russia, Moscow, Russian Federation
- 3 Radioelectronics and Laser Technology RandD Center, Bauman Moscow State Technical University, Moscow, Russian Federation
Keywords
Degradation; I-V characteristic; Passive tag; Power supply system; Radio frequency identification; Reliability; Resonant-tunneling diode
Date of creation
04.02.2019
Date of change
04.02.2019
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