Determining the optical parameters of conductive materials by polarimetry

This paper proposes a polarimetric method of determining the optimum conditions for photon excitation of surface plasmons (SPs). The method makes it possible to improve the accuracy with which the effective optical parameters of conductive samples are determined by an order of magnitude by using the phenomenon of zero reflection, which occurs for optimum excitation of SPs. The method is checked by means of an LEF-3M ellipsometer, in which a rotatable phase plate was used as an adjustable compensator. Measurements were made for an opaque copper mirror using a PCSA ellipsometric system with fixed polarizer at a probe-radiation wavelength of 0.6328 μm. © 2001 The Optical Society of America.

Publisher
Optical Society of America (OSA)
Number of issue
10
Language
English
Pages
747-750
Status
Published
Volume
68
Year
2001
Organizations
  • 1 Russ. Univ. Friendship of Nations, Moscow, Russian Federation
Keywords
Photon excitation; Conductive materials; Ellipsometry; Light reflection; Mirrors; Polarimeters; Photons
Date of creation
19.10.2018
Date of change
19.10.2018
Short link
https://repository.rudn.ru/en/records/article/record/351/