Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN<sub>2</sub>

Authors

De Boer T. ¹ , Moewes A. ¹ , Häusler J. ² , Rudel S.S. ² , Schnick W. ² , Strobel P. ³ , Boyko T.D. ⁴

Journal

Issue number

Language

English

Pages

27959-27965

State

Published

Volume

125

Year

2021

Organizations

Cite

Article

Соколова М.А.

Студенческий вестник. 2021. P.. 53-56

Article

Huyghebaert D., St.-Maurice J.P., Mcwilliams K., Hussey G., Howarth A.D., Rutledge P., Erion S.

Journal of Geophysical Research: Space Physics. Vol. 126. 2021. e2021JA029857 p..

Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN₂