Detecting a Hierarchy of Deep-Level Defects in the Model Semiconductor ZnSiN2

Authors
De Boer T. 1 , Moewes A. 1 , Häusler J.2 , Rudel S.S.2 , Schnick W.2 , Strobel P.3 , Boyko T.D. 4
Journal
Journal of Physical Chemistry C
Number of issue
51
Language
English
Pages
27959-27965
Status
Published
Volume
125
Year
2021
Organizations
  • 1 Department of Physics and Engineering Physics|University of Saskatchewan
  • 2 Department of Chemistry|University of Munich (LMU)
  • 3 Lumileds Germany
  • 4 Canadian Light Source
Date of creation
11.07.2024
Date of change
11.07.2024
Short link
https://repository.rudn.ru/en/records/article/record/153470/
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