USE OF WAVEGUIDE LIGHT SCATTERING FOR PRECISION MEASUREMENTS OF THE STATISTICAL PARAMETERS OF IRREGULARITIES OF INTEGRATED OPTICAL WAVEGUIDE MATERIALS ArticleYegorov A.A.Optical Engineering. Vol. 44. 2005. P.. 1-10
DOUBLE-CURVATURE SURFACES IN MIRROR SYSTEM DESIGN ArticleSasian J.M.Optical Engineering. Vol. 36. 1997. P.. 183-188
ANNULAR SURFACES IN ANNULAR FIELD SYSTEMS ArticleSasian J.M.Optical Engineering. Vol. 36. 1997. P.. 3401-3403