Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 3724.
1999.
С. 33-38
Proceedings of SPIE - The International Society for Optical Engineering
Тип
Журнал
Сокращенное название на английском и других языках, кроме русского
Proc SPIE Int Soc Opt Eng
Издательство
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States
Коды
ISSN: 0277-786X
Поделиться
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 3736.
1999.
С. 351-356
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 3736.
1999.
С. 351-356
DETERMINATION OF PARAMETERS OF STATISTICAL ENSEMBLE OF MICROOBJECTS IN WAVEGUIDE OPTICAL MICROSCOPE
Статья
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 3736.
1999.
С. 375-384
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 2982.
1997.
С. 18-24
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 3200.
1997.
С. 32-40
THE WAVEGUIDE GAS ANALYZER
Статья
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 3200.
1997.
С. 41-43
WAVEGUIDE OPTICAL MICROSCOPY
Статья
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 3200.
1997.
С. 114-120
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 3200.
1997.
С. 121-125
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 2778.
1996.
С. 19-20
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 2965.
1996.
С. 113-116
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 2965.
1996.
С. 117-120
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 2969.
1996.
С. 237-240
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 2799.
1996.
С. 449-457
EXCITED EECTRONIC STALES AND PHOTOPROCESSES IN THE SERIES N,O,S POLIATOMIC LASERS ACTIVE MOLECULES
Статья
Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 2778.
1996.
С. 640-641
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Другие источники записей
THERMAL ENGINEERING
Журнал
IAPC Nauka/Interperiodica.
RUSSIAN PHYSICS JOURNAL
Журнал
Springer New York LLC.