Defects in α-Fe induced by intense-pulsed ion beam (IPIB)

Using Rutherford back-scattering (RBS), secondary ion mass spectrometry (SIMS), Auger-electron spectroscopy (AES), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) techniques, formation of different point and linear defects have been found in iron as a result of intense pulsed-ion beam (IPIB) treatment. The close correlation between an average scalar dislocation density with a microhardness magnitude has been proved both in near-surface layers and at large depths. The comparable analysis of structure-phase damage after IPIB and intense pulsed-electron beam irradiation is interesting for an explanation of different modified properties and an application of such treatments in technologies.

Авторы
Valyaev A.N.1 , Ladysev V.S.1 , Mendygaliev D.R.1 , Pogrebnjak A.D.2 , Valyaev A.A.3 , Pogrebnjak N.A. 4
Редакторы
-
Издательство
Elsevier Science Publishers B.V., Amsterdam
Номер выпуска
4
Язык
Английский
Страницы
481-486
Статус
Опубликовано
Подразделение
-
Номер
-
Том
171
Год
2000
Организации
  • 1 Technical University, Ctr. Irradiat. Mat., Lugovaye S., Ust-Kamenogorsk 492010, Kazakhstan
  • 2 Laboratory of Beam Technology, Nagaoka Univ. Technol., N., Nagaoka, Japan
  • 3 Tech. Univ. of Electron. Engineering, Moscow 103498, Russian Federation
  • 4 People's Friendship University, Moscow 130240, Russian Federation
Ключевые слова
Auger electron spectroscopy; Backscattering; Dislocations (crystals); Electron beams; Electron irradiation; Ion beams; Microhardness; Point defects; Secondary ion mass spectrometry; Shock waves; Transmission electron microscopy; Intense pulsed ion beams (IPIB); Iron
Дата создания
19.10.2018
Дата изменения
19.10.2018
Постоянная ссылка
https://repository.rudn.ru/ru/records/article/record/498/