Ellipsometric microscopy under conditions of surface plasmon resonance

This paper discusses the possibility of using ellipsometric microscopy to study a flat conductive surface when surface plasmons are excited on it by probe radiation. © 1998 The Optical Society of America.

Authors
Editors
-
Publisher
Optical Society of America (OSA)
Number of issue
11
Language
English
Pages
952-953
Status
Published
Department
-
DOI
-
Number
-
Volume
65
Year
1998
Organizations
  • 1 Russ. Univ. Friendship of Nations, Moscow, Russian Federation
Keywords
Ellipsometry; Light interference; Resonance; Surface waves; Ellipsometric microscopy; Surface plasmon resonance; Optical microscopy
Date of creation
19.10.2018
Date of change
19.10.2018
Short link
https://repository.rudn.ru/en/records/article/record/631/