Reliability prediction of RFID passive tags power supply systems based on RTD under given operating conditions

The technique for predicting RFID passive tag power supply system reliability, the failure of which is caused by the degradation of RTDs that are part of the tag rectifier, is developed. The calculation of the time to failure of the RFID passive tag power supply system by the criterion of the minimum permissible range is presented based on the developed technique. © The Authors, published by EDP Sciences, 2018.

Authors
Makeev M. 1, 2 , Sinyakin V.1 , Meshkov S.1
Conference proceedings
MATEC Web of Conferences
Publisher
EDP Sciences
Language
English
Status
Published
DOI
10.1051/matecconf/201822402095
Number
02095
Volume
224
Year
2018
Organizations
  • 1 Bauman Moscow State Technical University, Moscow, 105005, Russian Federation
  • 2 Peoples' Friendship University of Russia (RUDN University), Moscow, 117198, Russian Federation
Keywords
Electric rectifiers; Manufacture; Outages; Reliability; Operating condition; Passive tags; Power supply; Reliability prediction; Time to failure; Electric power systems
Date of creation
04.02.2019
Date of change
04.02.2019
Short link
https://repository.rudn.ru/en/records/article/record/36273/
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