Экспозиция Нефть Газ. 2011. P.. 43-45
Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy
Authors
Zatsepin D.A. 1, 4 , Kurmaev E.Z. 1 , Hunt A. 2 , Moewes A. 2 , Gavrilov N.V. 3 , Zhidkov I.S. 4 , Cholakh S.O. 4
Publisher
Elsevier B.V.
Issue number
18
Language
English
Pages
3381-3384
State
Published
Volume
357
Year
2011
Organizations
- 1 X-ray Emission Spectroscopy Lab|Institute of Metal Physics|RAS Ural Div.
- 2 Ural Federal University
- 3 Department of Physics and Engineering Physics|University of Saskatchewan
- 4 Institute of Electrophysics|RAS Ural Div.
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Other records
Acta Crystallographica. Section E: Structure Reports Online. Vol. 67. 2011. P.. o1128-o1129