Экспозиция Нефть Газ.
2011.
P. 43-45
Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy
Authors
Zatsepin D.A.1,
4
,
Kurmaev E.Z.1
,
Hunt A.
2
,
Moewes A.
2
,
Gavrilov N.V.
3
,
Zhidkov I.S.4
,
Cholakh S.O.4
Publisher
Elsevier B.V.
Number of issue
18
Language
English
Pages
3381-3384
Status
Published
Volume
357
Year
2011
Organizations
- 1 X-ray Emission Spectroscopy Lab|Institute of Metal Physics|RAS Ural Div.
- 2 Ural Federal University
- 3 Department of Physics and Engineering Physics|University of Saskatchewan
- 4 Institute of Electrophysics|RAS Ural Div.
Date of creation
08.07.2024
Date of change
08.07.2024
Share
Other records
Acta Crystallographica. Section E: Structure Reports Online.
John Wiley & Sons.
Vol. 67.
2011.
P. o1128-o1129