Interfacial properties and characterization of Sc/Si multilayers

Авторы

Shendruk T.N. ¹ , Moewes A. ¹ , Kurmaev E.Z. ² , Ochin P. ³ , Maury H. ^4, ⁵ , André J.M. ^4, ⁵ , Le Guen K. ^4, ⁵ , Jonnard P. ^4, ⁵

Journal

Номер выпуска

Язык

English

Страницы

3808-3812

Статус

Published

Том

518

Год

2010

Организации

¹ Department of Physics and Engineering Physics|University of Saskatchewan
² Institute of Metal Physics|Russian Academy|Sciences-Ural Division
³ ICMPE Institut de Chimie et Matériaux Paris Est|CNRS-Université Paris XII UMR 7182
⁴ Laboratoire de Chimie Physique-Matiére et Rayonnement|UPMC Univ Paris 06
⁵ CNRS-UMR 7614

Цитировать

Article

Kartashkin V.A., Abashidze A.Kh.

International Journal on Minority and Group Rights. Том 10. 2003. С. 203-220

Article

Jin J., Xu W., Zhou Y.X., Zhang X.Y., Chang G.S., Moewes A., Finkelstein L.D., Kurmaev E.Z., Boukhvalov D.W.

Solid State Communications. Том 150. 2010. С. 1065-1068