Interfacial properties and characterization of Sc/Si multilayers

Authors
Shendruk T.N. 1 , Moewes A. 1 , Kurmaev E.Z.2 , Ochin P.3 , Maury H.4, 5 , André J.M.4, 5 , Le Guen K.4, 5 , Jonnard P.4, 5
Journal
Thin Solid Films
Number of issue
14
Language
English
Pages
3808-3812
Status
Published
Volume
518
Year
2010
Organizations
  • 1 Department of Physics and Engineering Physics|University of Saskatchewan
  • 2 Institute of Metal Physics|Russian Academy|Sciences-Ural Division
  • 3 ICMPE Institut de Chimie et Matériaux Paris Est|CNRS-Université Paris XII UMR 7182
  • 4 Laboratoire de Chimie Physique-Matiére et Rayonnement|UPMC Univ Paris 06
  • 5 CNRS-UMR 7614
Date of creation
08.07.2024
Date of change
08.07.2024
Short link
https://repository.rudn.ru/en/records/article/record/122952/
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