Characterization of CNx films by X-ray emission measurements

Authors
Kurmaev E.Z. 1 , Shamin S.N. 1 , Moewes A. 2, 6 , Winarski R.P. 3 , Ederer D.L. 3 , Feng J.Y. 4 , Turner S.S. 5
Journal
Thin Solid Films
Issue number
1-2
Language
English
Pages
60-64
State
Published
Volume
402
Year
2002
Organizations
  • 1 Institute of Metal Physics|Russian Academy of Sciences-Ural Division
  • 2 University of Sashatchewan|Departments of Physics and Engineering Physics
  • 3 Department of Physics and Engineering Physics|University of Saskatchewan
  • 4 Department of Physics|Tulane University
  • 5 Department of Materials Science and Engineering|Tsinghua University
  • 6 Royal Institution of Great Britain
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EFFECT OF CO DOPING ON THE ELECTRONIC STRUCTURE OF MGCNI3

Article
Shein I.R., Ivanovskii A.L., Kurmaev E.Z., Finkelstein L.D., Moewes A., Chiuzbian S., Neumann M., Ren Z.A., Che G.C.
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