Characterization of CN_x films by X-ray emission measurements

Kurmaev E.Z.¹ , Shamin S.N.¹ , Moewes A. ^{2, 6} , Winarski R.P. ³ , Ederer D.L. ³ , Feng J.Y.⁴ , Turner S.S.⁵

Thin Solid Films

1-2

English

60-64

Published

402

2002

• ¹ Institute of Metal Physics|Russian Academy of Sciences-Ural Division
• ² University of Sashatchewan|Departments of Physics and Engineering Physics
• ³ Department of Physics and Engineering Physics|University of Saskatchewan
• ⁴ Department of Physics|Tulane University
• ⁵ Department of Materials Science and Engineering|Tsinghua University
• ⁶ Royal Institution of Great Britain