HIGH EFFECTIVE TXRF SPECTROMETRY WITH USING WAVEGUIDE-RESONANCE STRUCTURES Article Egorov E.V., Egorov V.K., Kotova A.A., Borisov S.A. Успехи прикладной физики. Vol. 7. 2019. P. 401-430
PECULIARITIES IN THE FORMATION OF X-RAY FLUXES BY WAVEGUIDE–RESONATORS OF DIFFERENT CONSTRUCTION Article Egorov V.K., Egorov E.V. Optics and Spectroscopy (English translation of Optika i Spektroskopiya). Vol. 124. 2018. P. 838-849
X-RAY FLUORESCENCE MATERIAL ANALYSIS INITIATED BY HIGH ENERGY PROTON BEAMS Article Egorov V.K., Egorov E.V., Afanas'Ev M.S. Journal of Physics: Conference Series. Institute of Physics Publishing. Vol. 1121. 2018.
STUDY OF SILICON CARBIDE EPITAXY ON SILICON SUBSTRATE Article Egorov V.K., Egorov E.V., Kukushkin S.A., Osipov A.V. Вакуумная техника, материалы и технология. Общество с ограниченной ответственностью "Электровакуумные технологии". 2018. P. 83-93
THE PHENOMENON MODEL OF X-RAY BEAM ANGULAR DIVERGENCE DECREASING FORMED BY COMPOSITE WAVEGUIDE-RESONATOR Article Egorov V.K., Egorov E.V. IOP Conference Series: Materials Science and Engineering. Institute of Physics Publishing. Vol. 387. 2018.
ABOUT PECULIARITIES OF X-RAY NANOPHOTONICS ON THE BASE OF THE PLANAR X-RAY WAVEGUIDE-RESONATORS Article Egorov V.K., Egorov E.V. Успехи прикладной физики. Vol. 5. 2017. P. 534-548