HIGH EFFECTIVE TXRF SPECTROMETRY WITH USING WAVEGUIDE-RESONANCE STRUCTURES ArticleEgorov E.V., Egorov V.K., Kotova A.A., Borisov S.A.Успехи прикладной физики. Том 7. 2019. С. 401-430
X-RAY FLUORESCENCE MATERIAL ANALYSIS INITIATED BY HIGH ENERGY PROTON BEAMS ArticleEgorov V.K., Egorov E.V., Afanas'ev M.S.Journal of Physics: Conference Series. Том 1121. 2018.
STUDY OF SILICON CARBIDE EPITAXY ON SILICON SUBSTRATE ArticleEgorov V.K., Egorov E.V., Kukushkin S.A., Osipov A.V.Вакуумная техника, материалы и технология. 2018. С. 83-93
PECULIARITIES IN THE FORMATION OF X-RAY FLUXES BY WAVEGUIDE–RESONATORS OF DIFFERENT CONSTRUCTION ArticleEgorov V.K., Egorov E.V.Optics and Spectroscopy (English translation of Optika i Spektroskopiya). Том 124. 2018. С. 838-849
THE PHENOMENON MODEL OF X-RAY BEAM ANGULAR DIVERGENCE DECREASING FORMED BY COMPOSITE WAVEGUIDE-RESONATOR ArticleEgorov V.K., Egorov E.V.IOP Conference Series: Materials Science and Engineering. Том 387. 2018.
ABOUT PECULIARITIES OF X-RAY NANOPHOTONICS ON THE BASE OF THE PLANAR X-RAY WAVEGUIDE-RESONATORS ArticleEgorov V.K., Egorov E.V.Успехи прикладной физики. Том 5. 2017. С. 534-548