Robust method for dielectric tensor evaluation from spectrophotometric data

This paper deals with the mathematical modeling of the interaction between the electromagnetic waves of the optical range and multilayer optical structures, the application of which is highly popular today. A robust method for calculating the optical properties of a single layer is described using the measured or required parameters. References to the scientific works reported in this area are presented. © 2011 Pleiades Publishing, Ltd.

Авторы
Номер выпуска
5
Язык
Английский
Страницы
494-497
Статус
Опубликовано
Том
8
Год
2011
Организации
  • 1 Peoples' Friendship University of Russia, Moscow, Russian Federation
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