Proceedings of SPIE - The International Society for Optical Engineering.
Society of Photo-Optical Instrumentation Engineers, Bellingham, WA, United States.
Том 4759.
2002.
С. 354-358
Guided mode scattering in an integrated planar optical waveguide with 3D small statistic irregularities was studied. The restoration of autocorrelation function of the substrate surface roughness from the far zone 2D scattering diagram in the presence of additive stochastic noise was demonstrated. A correct solution of the direct and inverse scattering problems was discussed using perturbation theory.