Interfacial properties and characterization of Sc/Si multilayers

Shendruk T.N. ¹ , Moewes A. ¹ , Kurmaev E.Z.² , Ochin P.³ , Maury H.^{4, 5} , André J.M.^{4, 5} , Le Guen K.^{4, 5} , Jonnard P.^{4, 5}

Thin Solid Films

14

Английский

3808-3812

Опубликовано

518

2010

• ¹ Department of Physics and Engineering Physics|University of Saskatchewan
• ² Institute of Metal Physics|Russian Academy|Sciences-Ural Division
• ³ ICMPE Institut de Chimie et Matériaux Paris Est|CNRS-Université Paris XII UMR 7182
• ⁴ Laboratoire de Chimie Physique-Matiére et Rayonnement|UPMC Univ Paris 06
• ⁵ CNRS-UMR 7614

08.07.2024

08.07.2024

https://repository.rudn.ru/ru/records/article/record/122952/