IMPROVEMENT OF RENORMALIZATION-SCALE UNCERTAINTIES WITHIN EMPIRICAL DETERMINATIONS OF THE B-QUARK MASS Статья Ahmady M.R., Elias V., Squires A., Steele T.G., Zhang A. International Journal of Modern Physics E. World Scientific Publishing Co.. Том 15. 2006. С. 571-594
BUFFER LAYER EFFECT ON THE STRUCTURAL AND ELECTRICAL PROPERTIES OF RUBRENE-BASED ORGANIC THIN-FILM TRANSISTORS Статья Seo J.H., Park D.S., Cho S.W., Kim C.Y., Jang W.C., Whang C.N., Yoo K.-H., Chang G.S., Pedersen T., Moewes A., Chae K.H., Cho S.J. Applied Physics Letters. American Institute of Physics. Том 89. 2006.