Russian Journal of Inorganic Chemistry.
IAPC Nauka/Interperiodica.
Том 46.
2001.
С. 1815-1819
Characterization of CNx films by X-ray emission measurements
Авторы
Kurmaev E.Z.1
,
Shamin S.N.1
,
Moewes A.
2,
6
,
Winarski R.P.
3
,
Ederer D.L.
3
,
Feng J.Y.4
,
Turner S.S.5
Журнал
Номер выпуска
1-2
Язык
Английский
Страницы
60-64
Статус
Опубликовано
Том
402
Год
2002
Организации
- 1 Institute of Metal Physics|Russian Academy of Sciences-Ural Division
- 2 University of Sashatchewan|Departments of Physics and Engineering Physics
- 3 Department of Physics and Engineering Physics|University of Saskatchewan
- 4 Department of Physics|Tulane University
- 5 Department of Materials Science and Engineering|Tsinghua University
- 6 Royal Institution of Great Britain
Дата создания
08.07.2024
Дата изменения
08.07.2024
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