Defects in α-Fe induced by intense-pulsed ion beam (IPIB)

Using Rutherford back-scattering (RBS), secondary ion mass spectrometry (SIMS), Auger-electron spectroscopy (AES), transmission electron microscopy (TEM) and scanning electron microscopy (SEM) techniques, formation of different point and linear defects have been found in iron as a result of intense pulsed-ion beam (IPIB) treatment. The close correlation between an average scalar dislocation density with a microhardness magnitude has been proved both in near-surface layers and at large depths. The comparable analysis of structure-phase damage after IPIB and intense pulsed-electron beam irradiation is interesting for an explanation of different modified properties and an application of such treatments in technologies.

Authors
Valyaev A.N.1 , Ladysev V.S.1 , Mendygaliev D.R.1 , Pogrebnjak A.D.2 , Valyaev A.A.3 , Pogrebnjak N.A. 4
Journal
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Publisher
Elsevier Science Publishers B.V., Amsterdam
Number of issue
4
Language
English
Pages
481-486
Status
Published
Link
External link
DOI
10.1016/S0168-583X(00)00294-9
Volume
171
Year
2000
Organizations
  • 1 Technical University, Ctr. Irradiat. Mat., Lugovaye S., Ust-Kamenogorsk 492010, Kazakhstan
  • 2 Laboratory of Beam Technology, Nagaoka Univ. Technol., N., Nagaoka, Japan
  • 3 Tech. Univ. of Electron. Engineering, Moscow 103498, Russian Federation
  • 4 People's Friendship University, Moscow 130240, Russian Federation
Keywords
Auger electron spectroscopy; Backscattering; Dislocations (crystals); Electron beams; Electron irradiation; Ion beams; Microhardness; Point defects; Secondary ion mass spectrometry; Shock waves; Transmission electron microscopy; Intense pulsed ion beams (IPIB); Iron
Date of creation
19.10.2018
Date of change
19.10.2018
Short link
https://repository.rudn.ru/en/records/article/record/498/
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