Proceedings of SPIE - The International Society for Optical Engineering.
SPIE.
2002.
P. 312-319
Using of the waveguide light scattering for precision measurements of the statistic parameters of irregularities of integrated optical waveguide's materials
Authors
Yegorov A.A.
1,
2,
3
Conference proceedings
Publisher
SPIE
Language
English
Pages
299-309
Status
Published
Year
2003
Organizations
- 1 Inventor's Council|Peoples' Friendship Univ. of Russia
- 2 Lab. of the Optics of the Surface|General Physics Institute|Russian Academy of Sciences
- 3 Apt. 76
Date of creation
08.07.2024
Date of change
08.07.2024
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