Analysis of octadecyltrichlorosilane treatment of organic thin-film transistors using soft x-ray fluorescence spectroscopy

Authors
Kang S.J.1 , Yi Y.1 , Kim C.Y.1 , Whang C.N.1 , Callcott T.A.2 , Krochak K. 3 , Moewes A. 3 , Chang G.S. 3
Journal
Applied Physics Letters
Publisher
American Institute of Physics
Number of issue
23
Language
English
Pages
1-3
Status
Published
Volume
86
Year
2005
Organizations
  • 1 Institute of Physics and Applied Physics|Yonsei University
  • 2 Department of Physics and Astronomy|University of Tennessee
  • 3 Department of Physics and Engineering Physics|University of Saskatchewan
Date of creation
08.07.2024
Date of change
08.07.2024
Short link
https://repository.rudn.ru/en/records/article/record/115602/
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