International Journal of Modern Physics E. Vol. 16. 2007. P.. 51-57
Buffer layer effect on the structural and electrical properties of rubrene-based organic thin-film transistors
Authors
Seo J.H. 1 , Park D.S. 1 , Cho S.W. 1 , Kim C.Y. 1 , Jang W.C. 1 , Whang C.N. 1 , Yoo K.-H. 1 , Chang G.S. 2 , Pedersen T. 2 , Moewes A. 2 , Chae K.H. 3 , Cho S.J. 4
Journal
Publisher
American Institute of Physics
Issue number
16
Language
English
State
Published
Volume
89
Year
2006
Organizations
- 1 Institute of Physics and Applied Physics|Yonsei University
- 2 Department of Physics and Engineering Physics|University of Saskatchewan
- 3 Division of Materials Science and Technology|Korea Institute of Science and Technology
- 4 Department of Physics|Kyungsung University
Share
Other records
The Journal of Chemical Physics. Vol. 126. 2007.