Technical Physics Letters

Type

Journal

Сокращенное название на английском и других языках, кроме русского

Tech. Phys. Lett.

Publisher

American Institute of Physics Inc.

Codes

ISSN: 1063-7850

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INFLUENCE OF THE WORKING SURFACE ROUGHNESS OF THE PULSED X-RAY RADIATION GALVANIC SENSOR ON ITS PERFORMANCE

Article

Barykov I. A., Butashin A. V., Zaitsev V. I., Muslimov A. E., Tarakanov I. A., Ismailov A. M., Fedorov V. A., Kanevsky V. M.

Technical Physics Letters. American Institute of Physics Inc.. Vol. 49. 2023. 19 p.

CONTACT ATOMIC FORCE MICROSCOPY OF BIOLOGICAL TISSUES

Article

Dedkov V.G., Dedkova E.G.

Technical Physics Letters. American Institute of Physics Inc.. Vol. 36. 2010. P. 130-132

METHOD FOR IDENTIFYING DIFFRACTION SATELLITES OF SURFACE PLASMONS IN TERAHERTZ FREQUENCY RANGE

Article

Gerasimov V.V., Knyazev B.A., Nikitin A.K., Nikitin V.V.

Technical Physics Letters. American Institute of Physics Inc.. Vol. 36. 2010. P. 1016-1019

APPLICATION OF HOLOGRAPHIC INTERFEROMETRY TO OPTICAL MONITORING OF SOLID SURFACES

Article

Zhizhin G.N., Nikitin A.K., Ryzhova T.A., Loginov A.P.

Technical Physics Letters. American Institute of Physics Inc.. Vol. 30. 2004. P. 927-929

FREQUENCY DOUBLING OF 859.2 NM RADIATION IN A WAVEGUIDE FORMED FROM NB2O5 AND TA2O5 FILMS ON A KTIOPO4 SUBSTRATE

Article

Zhitkov P.M., Agapov A.Yu., Shevtsov V.M.

Technical Physics Letters. American Institute of Physics Inc.. Vol. 25. 1999. P. 896-899

FREQUENCY DOUBLING OF 859.2 NM RADIATION IN A WAVEGUIDE FORMED FROM NB2O5 AND TA2O5 FILMS ON A KTIOPO4 SUBSTRATE

Article

Zhitkov P.M., Agapov A.Yu., Shevtsov V.M.

Technical Physics Letters. American Institute of Physics Inc.. Vol. 25. 1999. P. 896-899

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Other record sources

HIGH TEMPERATURES - HIGH PRESSURES

Journal

Old City Publishing.

PROCEEDINGS - INTERNATIONAL UNIVERSITY CONFERENCE "ELECTRONICS AND RADIOPHYSICS OF ULTRA-HIGH FREQUENCIES"

Conference proceedings

1999 International University Conference Electronics and Radiophysics of Ultra-High Frequencies"". Institute of Electrical and Electronics Engineers Inc..