σ and π-band dispersion of graphite from polarized resonant inelastic X-Ray scattering measurements

Resonant inelastic X-Ray scattering of highly oriented pyrolytic graphite (HOPG) is observed above the C 1s threshold at different polarization angles. It is shown that combining the polarization and excitation energy dependence of X-Ray emission spectra makes it possible to perform the quantitative band mapping selective to the chemical bonding (σ and π ).

Authors
Sokolov A.V1 , Kurmaev E.Z.1 , MacNaughton J. 2 , Moewes A. 2 , Skorikov N.A.1 , Finkelstein L.D.1
Number of issue
2
Language
English
Pages
114-117
Status
Published
Volume
77
Year
2003
Organizations
  • 1 Institute of Metal Physics Ural Division RAS
  • 2 Department of Physics and Engineering Physics, University of Saskatchewan
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