INFLUENCE OF THE WORKING SURFACE ROUGHNESS OF THE PULSED X-RAY RADIATION GALVANIC SENSOR ON ITS PERFORMANCE СтатьяBarykov I. A., Butashin A. V., Zaitsev V. I., Muslimov A. E., Tarakanov I. A., Ismailov A. M., Fedorov V. A., Kanevsky V. M.Technical Physics Letters. Том 49. 2023. 19 с.
METHOD FOR IDENTIFYING DIFFRACTION SATELLITES OF SURFACE PLASMONS IN TERAHERTZ FREQUENCY RANGE СтатьяGerasimov V.V., Knyazev B.A., Nikitin A.K., Nikitin V.V.Technical Physics Letters. Том 36. 2010. С. 1016-1019
CONTACT ATOMIC FORCE MICROSCOPY OF BIOLOGICAL TISSUES СтатьяDedkov V.G., Dedkova E.G.Technical Physics Letters. Том 36. 2010. С. 130-132
APPLICATION OF HOLOGRAPHIC INTERFEROMETRY TO OPTICAL MONITORING OF SOLID SURFACES СтатьяZhizhin G.N., Nikitin A.K., Ryzhova T.A., Loginov A.P.Technical Physics Letters. Том 30. 2004. С. 927-929
FREQUENCY DOUBLING OF 859.2 NM RADIATION IN A WAVEGUIDE FORMED FROM NB<SUB>2</SUB>O<SUB>5</SUB> AND TA<SUB>2</SUB>O<SUB>5</SUB> FILMS ON A KTIOPO<SUB>4</SUB> SUBSTRATE СтатьяZhitkov P.M., Agapov A.Yu., Shevtsov V.M.Technical Physics Letters. Том 25. 1999. С. 896-899
PROCEEDINGS - INTERNATIONAL UNIVERSITY CONFERENCE "ELECTRONICS AND RADIOPHYSICS OF ULTRA-HIGH FREQUENCIES" Сборник материалов конференции1999 International University Conference Electronics and Radiophysics of Ultra-High Frequencies"". Institute of Electrical and Electronics Engineers Inc..